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In relation to this article, we declare that there is no conflict of interest.
Publication history
Received October 28, 2002
Accepted January 22, 2003
articles This is an Open-Access article distributed under the terms of the Creative Commons Attribution Non-Commercial License (http://creativecommons.org/licenses/bync/3.0) which permits unrestricted non-commercial use, distribution, and reproduction in any medium, provided the original work is properly cited.
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Photoelectrocatalytic Degradation of Phenol Using a TiO2/Ni Thin-film Electrode

Department of Environmental Engineering, Zhejiang University, Hangzhou 310027, China
Korean Journal of Chemical Engineering, July 2003, 20(4), 679-684(6), 10.1007/BF02706907
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Abstract

As a new type of photoelectrode, TiO2/Ni thin-film electrode was prepared by dip-coating technique. The structural and surface morphology of electrode was examined by X-ray diffraction (XRD) and scanning electron microscope (SEM). Effects of initial phenol concentration, pH value, number of film layers, voltage of electrical bias applied, variation of inorganic salt type and types of dissolved gas on the photoelectrocatalytic (PEC) degradation of phenol using ultraviolet (UV) illuminated TiO2/Ni thin-film electrode were investigated. The mechanism of PEC degradation of phenol was also studied by analyzing reaction intermediates.

References

Bickley IB, Gonzalez CT, Lees JS, J. Solid State Chem., 92, 178 (1991) 
Candal RJ, Zeltner WA, Anderson MA, J. Adv. Oxidat. Technol., 3(3), 270 (1998)
Carey JH, Lawrence J, Tosine HM, Bull. Environ. Contam. Toxicol., 16(6), 697 (1976) 
Choi A, Termin W, hoffmann MR, J. Phys. Chem., 98, 13669 (1994) 
Kesselman JM, Lewis NS, hoffman MR, Environ. Sci. Technol., 31(8), 2298 (1997) 
Kim DH, Anderson MA, Environ. Sci. Technol., 28(3), 479 (1994) 
Leng WH, Liu H, Cheng SA, Zhang JQ, Cao CN, J. Photochem. Photobiol. A-Chem., 131, 125 (2000) 
Li XZ, Li FB, Environ. Sci. Technol., 35(11), 2381 (2001) 
Li XZ, Li FB, Fan CM, Sun YP, Water Res., 36(9), 2215 (2002) 
Lu MC, Roam GD, Chen JN, Huang CP, Water Res., 30(7), 1670 (1996) 
Morison SR, "Electrochemistry at Semiconductor and Oxidized Metal Electrodes," Plenum Publishing Corp., New York, N.Y. (1984)
Ollis DF, Pelizzetti E, Serpone N, Environ. Sci. Technol., 25(9), 1522 (1991) 
Park DR, Ahn BJ, Park HS, Yamashita H, Anpo M, Korean J. Chem. Eng., 18(6), 930 (2001)
Sclafani A, Herrmann JM, J. Phys. Chem., 100(32), 13655 (1996) 
Tanaka K, Capule MFV, Hisanaga T, Chem. Phys. Lett., 187(1-2), 73 (1991) 
Tang WZ, Huren A, Chemosphere, 31(9), 4157 (1995) 
Vinodgopal K, Hotchandani S, Kamat PV, J. Phys. Chem., 97, 9040 (1993) 
Vinodgopal K, Kamat PV, Chemtech, 4, 18 (1996)
Vulliet E, Emmelin C, Chovelon JM, Guillard C, Herrmann JM, Appl. Catal. B: Environ., 38(2), 127 (2002) 
Yu JG, Zhao XJ, Mater. Res. Bull., 36(1-2), 97 (2001) 

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