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In relation to this article, we declare that there is no conflict of interest.
Publication history
Received March 13, 2003
Accepted June 17, 2003
articles This is an Open-Access article distributed under the terms of the Creative Commons Attribution Non-Commercial License (http://creativecommons.org/licenses/bync/3.0) which permits unrestricted non-commercial use, distribution, and reproduction in any medium, provided the original work is properly cited.
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Three-Way Data Analysis with Time Lagged Window for On-Line Batch Process Monitoring

Department of Chemical Engineering, Chung-Yuan Christian University, Chung-Li, 320, Taiwan
Korean Journal of Chemical Engineering, November 2003, 20(6), 1000-1011(12), 10.1007/BF02706928
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Abstract

In this paper, on-line batch process monitoring is developed on the basis of the three-way data structure and the time-lagged window of process dynamic behavior. Two methods, DPARAFAC (dynamic parallel factor analysis) and DTri-PLS (dynamic trilinear partial least squares), are used here depending on the process variables only or on the process variables and quality indices, respectively. Although multivariate analysis using such PARAFAC (parallel factor analysis) and Tri-PLS (trilinear partial least squares) models has been reported elsewhere, they are not suited for practicing on-line batch monitoring owing to the constraints of their data structures. A simple modification of the data structure provides a framework wherein the moving window based model can be incorporated in the existing three-way data structure to enhance the detectability of the on-line batch monitoring. By a sequence of time window of each batch, the proposed ethodology is geared toward giving meaningful results that can be easily connected to the current measurements without the extra computation for the estimation of unmeasured process variables. The proposed method is supported by using two sets of benchmark fault detection problems. Comparisons with the existing two-way and three-way multiway statistical process control methods are also included.

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