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Received March 2, 2007
Accepted July 12, 2007
- This is an Open-Access article distributed under the terms of the Creative Commons Attribution Non-Commercial License (http://creativecommons.org/licenses/bync/3.0) which permits unrestricted non-commercial use, distribution, and reproduction in any medium, provided the original work is properly cited.
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Feasibility study to design a particle deposition unit utilizing electrophoresis for off-line measurements
Department of Chemical Engineering, University of Seoul, 90 Jeonnong-dong Dongdaemun-gu, Seoul 130-743, Korea
jhkimad@uos.ac.kr
Korean Journal of Chemical Engineering, March 2008, 25(2), 377-382(6), 10.1007/s11814-008-0063-9
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Abstract
Nanoparticles are widely used in various applications such as catalysts, mechanical polishing, composite materials, size standards, and structural templates. For those applications, sometimes it is necessary to sample nanoparticles onto clean substrates and onto a designated area. In this article, electrophoresis is demonstrated as a very feasible method to sample the desired number of particles onto a specific area of a substrate without contamination problems. In addition, an analytical equation was derived for estimation of deposition area, and compared with the experimental results. Pure copper particles generated by spray pyrolysis were used for size-classifications and depositions. Particle depositions were performed at 2,000 V and 7,000 V, and light scattering parameters from those deposited samples were measured; results showed good agreement of deposition area between estimations and measurements. Therefore, the use of the electrophoresis is promising in sampling particulates onto clean substrates without contamination and onto the designated sampling area with controlled number density.
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References
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Nah JW, Jeong YI, Koh JJ, Korean J. Chem. Eng., 17(2), 230 (2000)
Park JY, Oh SG, Ha BH, Korean J. Chem. Eng., 18(2), 215 (2001)
Suh DJ, Park OO, Jung HT, Kwon MH, Korean J. Chem. Eng., 19(3), 529 (2002)
Yu YT, Mulvaney P, Korean J. Chem. Eng., 20(6), 1176 (2003)
Yun CY, Chah S, Kang SK, Yi J, Korean J. Chem. Eng., 21(5), 1062 (2004)
Kim JH, Ehrman SH, Mulholland GW, Germer TA, Appl. Optics, 41, 5405 (2002)
Kim JH, Ehrman SH, Mulholland GW, Germer TA, Appl. Optics, 43, 585 (2004)
Deppert K, Schmidt F, Krinke T, Dixkens J, Fissan H, J. Aerosol Sci., 27, S151 (1996)
Dixkens J, Fissan H, Aerosol Sci. Technol., 30, 438 (1999)
Slattery JC, Advanced transport phenomena, Cambridge University, Cambridge (1999)
Knutson EO, Whitby KT, J. Aerosol Sci., 6, 443 (1975)
Liu BYH, Fine particles: Aerosol generation, measurement, sampling,and analysis, Academic Press, New York (1976)
Kim JH, Babushok VI, Germer TA, Mulholland GW, Ehrman SH, J. Mater. Res., 18, 1614 (2003)
Kim JH, Mulholland GW, Kukuck SC, Pui DY, J. Res. Natl. Inst. Stand. Technol., 110, 31 (2005)
Germer TA, Asmail CC, Rev. Sci. Instrum., 70, 3688 (1999)
Kim JH, Germer TA, Mulholland GW, Ehrman SH, Adv. Mater., 14(7), 518 (2002)