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Received May 22, 2009
Accepted June 24, 2009
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Dependence of approaching velocity on the force-distance curve in AFM analysis
Department of Chemical Engineering, Kwangwoon University, Seoul 139-701, Korea 1School of Chemical & Biological Engineering, Seoul National University, Seoul 151-742, Korea
korea1@kw.ac.kr
Korean Journal of Chemical Engineering, January 2010, 27(1), 324-327(4), 10.1007/s11814-009-0314-4
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Abstract
The force-distance (F-D) curve in AFM analysis is a useful technique in the field of biophysics and surface science for measuring the physical/chemical properties of a substrate. Herein, the dependence of Vz on the F-D curve has been described via a theoretical investigation confirmed with measured data. The results show the attractive force was gradually reduced above a Vz of 5 μm/s by increasing the external repulsive force loaded onto the cantilever. To obtain a non-distorted F-D curve, one of two methods should be used: to analyze F-D curve under Vz of 1 μm/s or use of a short/stiff cantilever.
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References
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Kim Y, Choi I, Kang SK, Lee J, Yi J, Appl. Phys. Lett., 86, 073113 (2005)
Cappella B, Dietler G, Surf. Sci. Rep., 34, 1 (1999)
Heinrich V, Leung A, Evans E, J. Chem. Inf. Model., 45, 1482 (2005)
Henry DJ, Evans E, Yarovsky I, J. Phys. Chem. B, 110(32), 15963 (2006)
Yiapanis G, Henry DJ, Evans E, Yarovsky I, J. Phys. Chem. B, 111, 6465 (2007)
Carpick RW, Ogletree DF, Salmeron M, J. Colloid Interface Sci., 211(2), 395 (1999)
Kwon J, Honh J, Kim YS, Lee DY, Lee S, Park S, Rev. Sci. Instrum., 74, 4378 (2003)
Kim Y, Yi J, J. Phys. Chem. B, 110(41), 20526 (2006)
Wojcikiewicz EP, Abdulreda MH, Zhang XH, Moy VT, Biomacromolecules, 7(11), 3188 (2006)
Kim H, Arakawa H, Hatae N, Sugimoto Y, Matsumoto O, Psada T, Ichikawa A, Ikai A, Ultramicroscopy, 106, 652 (2006)
Jones RE, Hart DP, Tribol. Int., 38, 335 (2005)
Argento C, French RH, J. Appl. Phys., 80, 6081 (1996)
Drelich J, Xu ZH, Masliyah J, Langmuir, 22(21), 8850 (2006)
Christenson HK, J. Phys. Chem., 97, 12034 (1993)
