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- In relation to this article, we declare that there is no conflict of interest.
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Received August 17, 2009
Accepted November 24, 2009
- This is an Open-Access article distributed under the terms of the Creative Commons Attribution Non-Commercial License (http://creativecommons.org/licenses/bync/3.0) which permits unrestricted non-commercial use, distribution, and reproduction in any medium, provided the original work is properly cited.
Copyright © KIChE. All rights reserved.
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Optical characterizations of GaN nanorods fabricated by natural lithography
Department of Chemical and Biological Engineering, Korea University, Seoul 136-701, Korea
Korean Journal of Chemical Engineering, February 2010, 27(2), 693-696(4), 10.1007/s11814-010-0107-9
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Abstract
We fabricated GaN/Sapphire nanorods by nanosphere lithography (NSL) using SiO2 nanospheres. Arrays of SiO2 nanospheres were packed on GaN, followed by dry-etching via inductively coupled plasma (ICP) etching. SiO2 nanospheres served as the etching mask under our etching conditions. Finally, a sapphire substrate under GaN was exposed by dry-etching. A significant blue shift was observed in the room temperature photoluminescence (PL) spectrum_x000D_
from GaN/Sapphire nanorods when the underlying Al2O3 was exposed. GaN nanorods were fabricated by simple and reproducible methods, where SiO2 nanospheres were successfully used as the etching mask. In addition, a blueshift in PL by the band-filling effect was observed due to the GaN nanostructures.
References
Nakamura S, Fasol G, The blue laser diode: GaN based light emitters and lasers, Springer, New York (1997)
Nakamura S, Senoh M, Nagahama S, Iwasa N, Yamada T, Matsushita T, Kiyoku H, Sugimoto Y, Japan J. Appl. Phys., 35, L74 (1996)
Hsueh TH, Huang HW, Kao CC, Chang YH, Ou-Yang MC, Kuo HC, Wang SC, Japan J. Appl. Phys., 44, 2661 (2005)
Chiu CH, Lu TC, Huang HW, Lai CF, Kao CC, Chu JT, Yu CC, Kuo HC, Wang SC, Lin CF, Hsueh TH, Nanotechnology, 18, 445201 (2007)
Chen HS, Yeh DM, Lu YC, Chen CY, Huang CF, Tang TY, Yang CC, Wu CS, Chen CD, Nanotechnology, 17, 1454 (2006)
Lin CF, Zheng JH, Yang ZJ, Dai JJ, Lin DY, Chang CY, Lai ZX, Hong CS, Appl. Phys. Lett., 88, 083121 (2006)
Chen CC, Yeh CC, Adv. Mater., 12(10), 738 (2000)
Kim YH, Lee JY, Lee SH, Oh JE, Lee HS, Appl. Phys. A, 80, 1635 (2005)
Tu LW, Hsiao CL, Chi TW, Lo I, Hsieh KY, Appl. Phys. Lett., 82, 1601 (2003)
Kim HM, Kim DS, Kang TW, Cho YH, Chung KS, Appl. Phys. Lett., 81, 2193 (2002)
Kuo SY, Kei CC, Hsiao CN, Chao CK, J. Vac. Sci. Technol. B, 24(2), 695 (2006)
Yu CC, Chu CF, Tsai JY, Huang HW, Hsueh TH, Lin CF, Wang SC, Japan J. Appl. Phys., 41, L910 (2002)
Stober W, Fink A, Bohn E, J. Colloid Interf. Sci., 26, 62 (1968)
Kim B, Jung H, Kim H, Bang J, Kim J, Thin Solid Films, 517, 3859 (2009)
Park JS, Park HJ, Hahn YB, Yi GC, Yoshikawa A, J. Vac. Sci. Technol. B, 21(2), 800 (2003)
Nakamura S, Senoh M, Nagahama S, Iwasa N, Yamada T, Matsushita T, Kiyoku H, Sugimoto Y, Japan J. Appl. Phys., 35, L74 (1996)
Hsueh TH, Huang HW, Kao CC, Chang YH, Ou-Yang MC, Kuo HC, Wang SC, Japan J. Appl. Phys., 44, 2661 (2005)
Chiu CH, Lu TC, Huang HW, Lai CF, Kao CC, Chu JT, Yu CC, Kuo HC, Wang SC, Lin CF, Hsueh TH, Nanotechnology, 18, 445201 (2007)
Chen HS, Yeh DM, Lu YC, Chen CY, Huang CF, Tang TY, Yang CC, Wu CS, Chen CD, Nanotechnology, 17, 1454 (2006)
Lin CF, Zheng JH, Yang ZJ, Dai JJ, Lin DY, Chang CY, Lai ZX, Hong CS, Appl. Phys. Lett., 88, 083121 (2006)
Chen CC, Yeh CC, Adv. Mater., 12(10), 738 (2000)
Kim YH, Lee JY, Lee SH, Oh JE, Lee HS, Appl. Phys. A, 80, 1635 (2005)
Tu LW, Hsiao CL, Chi TW, Lo I, Hsieh KY, Appl. Phys. Lett., 82, 1601 (2003)
Kim HM, Kim DS, Kang TW, Cho YH, Chung KS, Appl. Phys. Lett., 81, 2193 (2002)
Kuo SY, Kei CC, Hsiao CN, Chao CK, J. Vac. Sci. Technol. B, 24(2), 695 (2006)
Yu CC, Chu CF, Tsai JY, Huang HW, Hsueh TH, Lin CF, Wang SC, Japan J. Appl. Phys., 41, L910 (2002)
Stober W, Fink A, Bohn E, J. Colloid Interf. Sci., 26, 62 (1968)
Kim B, Jung H, Kim H, Bang J, Kim J, Thin Solid Films, 517, 3859 (2009)
Park JS, Park HJ, Hahn YB, Yi GC, Yoshikawa A, J. Vac. Sci. Technol. B, 21(2), 800 (2003)