Wavelet texture analysis has been applied to solve many problems in process industries as well as in other industries. In solving problems from process industries however, its potentials have never been explored to the full extent yet. This is not only because techniques used in wavelet texture analysis are still unfamiliar to researchers and practitioners in process industries, but also because characteristics of the scenes displayed by the images in process industries are difficult to analyze: products and processes in process industries mostly have stochastic outside appearance. The purpose of this article is to give an overview of state-of-the-art methods in wavelet texture analysis through an illustrative example from process industries.

Image Texture Analysis Process Industries Stochastic Appearance Wavelet Texture Analysis

Gonzalez RC, Woods RE, Digital image processing., Addison-Wesley, Reading (1993)
IEEE Standard 610.4. (1990)
Livens S, Image analysis for material characterization., Ph.D Thesis, University of Antwerp, Belgium (1998)
Randen T, Filter and filter bank design for image texture recognition., Ph.D Thesis, NTNU, Norway (1997)
Tuceryan M, Jain AK, in Handbook of pattern recognition and computer vision, Texture Analysis. C. H. Chen Eds., World Scientific Publishing, NJ (1998)
Van De Wouer G, Wavelets for multiscale texture analysis., Ph.D Thesis, University of Antwerp, Belgium (1998)
Liu JJ, Machine vision for process industries: Monitoring, control and optimization of visual quality of processes and products, Ph.D Thesis, McMaster University, Canada (2004)
Liu JJ, MacGregor JF, Duchesne C, Bartolacci G, Minerals Engineering., 18(1), 65 (2005)
Liu JJ, MacGregor JF, Minerals Engineering., 21(9), 642 (2008)
Liu JJ, MacGregor JF, Machine Vision and Applications., 16, 374 (2006)
Liu JJ, Macgregor JF, Ind. Eng. Chem. Res., 44(13), 4687 (2005)
Garcia-Munoz S, Gierer DG, Int. J. Pharm., 395, 104 (2010)
Gosselin R, Rodrigue D, Duchesne C, Comput. Chem. Eng., In Press (2010)
Reis MS, Bauer A, Chemometrics and Intelligent Laboratory Systems., 95, 129 (2009)
Bharati M, Liu JJ, MacGregor JF, Chemometrics and Intelligent Laboratory Systems., 72(1), 57 (2004)
Materka A, Strzelecki M, COST B11 Report, Technical University of Lodz, Institute of Electronics, Brussels (1998)
Vetterli M, Kovacevic J, Wavelets and subband coding., Prentice Hall, Englewood Cliffs (1995)
Julesz B, Scientific American., 232, 34 (1975)
Haralick RM, Shanmugam K, Dinstein I, IEEE Transactions on Systems, Man, and Cybernetics., 3, 610 (1973)
He DC, Wang L, Pattern Recognition., 25, 391 (1991)
Sun C, Wee WG, Computer Vision, Graphics, and Image Processing., 23, 341 (1983)
Levine MD, Vision in man and machine., McGraw-Hill Inc., New York (1985)
Cross G, Jain A, IEEE Transactions on Pattern Analysis and Machine Intelligence., 5, 25 (1983)
Keller JM, Chen S, Crownover RM, Computer Vision, Graphics, and Image Processing., 45, 150 (1989)
Daugman JG, in Computational Neuroscience, E. L. Schwartz Ed., MIT Press, Cambridge (1988)
Chang T, Kuo CCJ, IEEE Transactions on Image Processing., 2, 429 (1993)
Etdmad K, Chellappa R, IEEE Transactions on Image Processing., 7, 1453 (1998)
Kirn D, Han C, Liu JJ, Ind. Eng. Chem. Res., 48(5), 2590 (2009)
Mallet Y, Coomans D, Kautsky J, De Vel O, IEEE Transactions on Pattern Analysis and Machine Intelligence., 19, 1058 (1997)
Mallat SG, IEEE Transactions on Pattern Analysis and Machine Intelligence., 11, 674 (1989)
Laine A, Fan J, IEEE Transactions on Pattern Analysis and Machine Intelligence., 15, 1186 (1995)
Liu JJ, Kim D, Han C, Ind. Eng. Chem. Res., 46(15), 5152 (2007)
Fisher RA, Annals of Eugenics., 7, 179 (1936)
Kwak N, IEEE Transactions on Pattern Analysis and Machine Intelligence., 30(9), 1672 (2008)
Cocchi M, Seeber R, Ulrici A, Chemometrics and Intelligent Laboratory Systems., 57(2), 97 (2001)
Walczak B, Massart DL, Chemometrics and Intelligent Laboratory Systems., 38(1), 39 (1997)
Biem A, Katagiri S, Juang BH, IEEE Transaction on Signal Processing., 45, 500 (1997)
Duin RPW, Umbach RH, IEEE Transaction on Pattern Analysis and Machine Intelligence., 23, 762 (2001)