Articles & Issues
- Language
- English
- Conflict of Interest
- In relation to this article, we declare that there is no conflict of interest.
- Publication history
-
Received January 28, 2012
Accepted February 29, 2012
-
This is an Open-Access article distributed under the terms of the Creative Commons Attribution Non-Commercial License (http://creativecommons.org/licenses/bync/3.0) which permits
unrestricted non-commercial use, distribution, and reproduction in any medium, provided the original work is properly cited.
Copyright © KIChE. All rights reserved.
All issues
Elucidation of morphological and optoelectronic properties of highly crystalline chalcopyrite (CuInSe2) nanoparticles synthesized via hot injection route
School of Chemical Engineering, Yeungnam University, Gyeongsan 712-749, Korea 1Research Center for Solar Energy Chemistry, Osaka University, 1-3, Machikaneyama, Toyonaka, Osaka 560-8531, Japan
Korean Journal of Chemical Engineering, October 2012, 29(10), 1453-1458(6), 10.1007/s11814-012-0026-z
Download PDF
Abstract
CuInSe2 (CIS) nanoparticles have been prepared by the hot-injection method with sizes ~25 nm, and the thermal annealing influence on the size, morphology and optoelectronic properties of crystalline CuInSe2 nanoparticles has been elucidated. Microstructural analysis of synthesized nanoparticles was performed by various characterization methods including high-resolution transmission electron microscopy (HR-TEM), Scanning TEM (STEM), Xray diffraction, X-ray photoelectron spectroscopy (XPS) and photoluminescence (PL) spectroscopy. The fast Fourier_x000D_
transform (FFT) pattern of HR-TEM image of annealed CuInSe2 nanoparticles illustrates that the particles have quasisingle crystal tetragonal structure, as also confirmed by the XRD pattern. The HR-TEM image clearly shows the fringe widths are in order without any defect with 0.32 nm. Microstructural analysis results clearly indicate that the synthesized and air-annealed nanoparticles are in highly crystalline state with near stoichiometric atomic composition.
References
Cahen D, Gilet JM, Schmitz C, Chernyak L, Gartsman K, Jakubowicz A, Science., 258, 271 (1992)
Guillemoles JF, Rau U, Kronik L, Schock HW, Cahen D, Adv. Mater., 11(11), 957 (1999)
Ramanathan K, Contreras MA, Perkins CL, Asher S, Hasoon FS, Keane J, Young D, Romero M, Metzger W, Noufi R, Ward J, Duda A, Progress in Photovoltaics., 11, 225 (2003)
Yang YH, Chen YT, J. Phys. Chem. B, 110(35), 17370 (2006)
Stolt L, Hedstrom J, Kessler J, Ruckh M, Velthaus KO, Schock HW, Appl. Phys. Lett., 62, 597 (1993)
Schulz DL, Curtis CJ, Flitton FA, Weisner H, Keane J, Matson RJ, Jones MJ, Parilla PA, Noufi R, Ginley DS, J. Electron. Mater., 27, 433 (1998)
Ye H, Park HS, Akhavan VA, Goodfellow BW, Panthani MG, Korgel BA, Bard AJ, J. Phys. Chem. C., 115, 234 (2011)
Castro SL, Bailey SG, Raffaelle RP, Banger KK, Hepp AF, Chem. Mater., 15, 3142 (2003)
GUILLEMOLES JF, LUSSON A, COWACHE P, MASSACCESI S, VEDEL J, LINCOT D, Adv. Mater., 6(5), 376 (1994)
Malik MA, O'Brien P, Revaprasadu N, Adv. Mater., 11(17), 1441 (1999)
Peng HL, Schoen DT, Meister S, Zhang XF, Cui Y, J. Am. Chem. Soc., 129(1), 34 (2007)
Powalla M, Dimmler B, Thin Solid Films, 361-362, 540 (2000)
Repins I, Contreras MA, Egaas B, DeHart C, Scharf J, Perkins CL, To B, Noufi R, Prog. PhotoVoltaics Res. Appl., 16, 235 (2008)
Contreras MA, Egaas B, Ramanathan K, Hiltner J, Swartzlander A, Hasoon F, Noufi R, Prog. PhotoVoltaics Res. Appl., 7, 311 (1999)
Schock HW, Noufi R, Prog. PhotoVoltaics Res. Appl., 8, 151 (2000)
Eberspacher C, Pauls KL, Serra JP, Mater. Res. Soc. Symp.Proc., B8.27.1, 763 (2003)
Kumar AP, Reddy KV, Thin Solid Films, 304(1-2), 365 (1997)
Gur I, Fromer NA, Geier ML, Alivisatos AP, Science., 310, 462 (2005)
Wu Y, Wadia C, Ma W, Sadtler B, Alivisatos AP, Nano Lett., 8, 2551 (2008)
Dayal S, Kopidakis N, Olson DC, Ginley DS, Rumbles G, J. Am. Chem. Soc., 10, 239 (2010)
Murray CB, Norris DJ, Bawendi MG, J. Am. Chem. Soc., 115, 8706 (1993)
Micic OI, Curtis CJ, Jones KM, Sprague JR, Nozik AJ, J. Phys. Chem., 98(19), 4966 (1994)
Ghezelbash A, Korgel BA, Langmuir, 21(21), 9451 (2005)
Xu J, Ge JP, Li YD, J. Phys. Chem. B, 110(6), 2497 (2006)
Holmes JD, Ziegler KJ, Doty RC, Pell LE, Johnston KP, Korgel BA, J. Am. Chem. Soc., 123(16), 3743 (2001)
Lu X, Korgel BA, Johnston KP, Chem. Mater., 17, 6479 (2005)
Eberspacher C, Pauls K, Serra J, 28th IEEE Photovoltaic Specialist Conference, IEEE, 517 (2000)
Choi SH, Kim EG, Hyeon T, J. Am. Chem. Soc., 128(8), 2520 (2006)
Krivanek OL, Nellist PD, Dellby N, Murfitt MF,Szilagyi A, Ultramicroscopy., 96, 229 (2003)
Kadavanich AV, Kippeny TC, Erwin MM, Pennycook SJ, Rosenthal SJ, J. Phys. Chem. B, 105(2), 361 (2001)
Nellist PD, Pennycook SJ, Ultramicroscopy., 78(1-4), 111 (1999)
Pennycook SJ, Nellist PD, Z-Contrast Scanning Transmission Electron Microscopy, in: Rickerby D, Valdre G, Valdre U (Eds.), Impact of Electron Scanning Probe Microscopy on Materials Research, Kluwer Academic Publishers, The Netherlands (1999)
Li B, Xie Y, Huang JX, Qian YT, Adv. Mater., 11(17), 1456 (1999)
Chichibu S, Mizutani T, Murakami K, Shioda T, Kurafuji T, J. Appl. Phys., 83, 3678 (1998)
Guo Q, Kim SJ, Kar M, Shafarman WN, Birkmire RW, Stach EA, Agrawal R, Hillhouse HW, Nano Lett., 8, 2982 (2008)
Guillemoles JF, Rau U, Kronik L, Schock HW, Cahen D, Adv. Mater., 11(11), 957 (1999)
Ramanathan K, Contreras MA, Perkins CL, Asher S, Hasoon FS, Keane J, Young D, Romero M, Metzger W, Noufi R, Ward J, Duda A, Progress in Photovoltaics., 11, 225 (2003)
Yang YH, Chen YT, J. Phys. Chem. B, 110(35), 17370 (2006)
Stolt L, Hedstrom J, Kessler J, Ruckh M, Velthaus KO, Schock HW, Appl. Phys. Lett., 62, 597 (1993)
Schulz DL, Curtis CJ, Flitton FA, Weisner H, Keane J, Matson RJ, Jones MJ, Parilla PA, Noufi R, Ginley DS, J. Electron. Mater., 27, 433 (1998)
Ye H, Park HS, Akhavan VA, Goodfellow BW, Panthani MG, Korgel BA, Bard AJ, J. Phys. Chem. C., 115, 234 (2011)
Castro SL, Bailey SG, Raffaelle RP, Banger KK, Hepp AF, Chem. Mater., 15, 3142 (2003)
GUILLEMOLES JF, LUSSON A, COWACHE P, MASSACCESI S, VEDEL J, LINCOT D, Adv. Mater., 6(5), 376 (1994)
Malik MA, O'Brien P, Revaprasadu N, Adv. Mater., 11(17), 1441 (1999)
Peng HL, Schoen DT, Meister S, Zhang XF, Cui Y, J. Am. Chem. Soc., 129(1), 34 (2007)
Powalla M, Dimmler B, Thin Solid Films, 361-362, 540 (2000)
Repins I, Contreras MA, Egaas B, DeHart C, Scharf J, Perkins CL, To B, Noufi R, Prog. PhotoVoltaics Res. Appl., 16, 235 (2008)
Contreras MA, Egaas B, Ramanathan K, Hiltner J, Swartzlander A, Hasoon F, Noufi R, Prog. PhotoVoltaics Res. Appl., 7, 311 (1999)
Schock HW, Noufi R, Prog. PhotoVoltaics Res. Appl., 8, 151 (2000)
Eberspacher C, Pauls KL, Serra JP, Mater. Res. Soc. Symp.Proc., B8.27.1, 763 (2003)
Kumar AP, Reddy KV, Thin Solid Films, 304(1-2), 365 (1997)
Gur I, Fromer NA, Geier ML, Alivisatos AP, Science., 310, 462 (2005)
Wu Y, Wadia C, Ma W, Sadtler B, Alivisatos AP, Nano Lett., 8, 2551 (2008)
Dayal S, Kopidakis N, Olson DC, Ginley DS, Rumbles G, J. Am. Chem. Soc., 10, 239 (2010)
Murray CB, Norris DJ, Bawendi MG, J. Am. Chem. Soc., 115, 8706 (1993)
Micic OI, Curtis CJ, Jones KM, Sprague JR, Nozik AJ, J. Phys. Chem., 98(19), 4966 (1994)
Ghezelbash A, Korgel BA, Langmuir, 21(21), 9451 (2005)
Xu J, Ge JP, Li YD, J. Phys. Chem. B, 110(6), 2497 (2006)
Holmes JD, Ziegler KJ, Doty RC, Pell LE, Johnston KP, Korgel BA, J. Am. Chem. Soc., 123(16), 3743 (2001)
Lu X, Korgel BA, Johnston KP, Chem. Mater., 17, 6479 (2005)
Eberspacher C, Pauls K, Serra J, 28th IEEE Photovoltaic Specialist Conference, IEEE, 517 (2000)
Choi SH, Kim EG, Hyeon T, J. Am. Chem. Soc., 128(8), 2520 (2006)
Krivanek OL, Nellist PD, Dellby N, Murfitt MF,Szilagyi A, Ultramicroscopy., 96, 229 (2003)
Kadavanich AV, Kippeny TC, Erwin MM, Pennycook SJ, Rosenthal SJ, J. Phys. Chem. B, 105(2), 361 (2001)
Nellist PD, Pennycook SJ, Ultramicroscopy., 78(1-4), 111 (1999)
Pennycook SJ, Nellist PD, Z-Contrast Scanning Transmission Electron Microscopy, in: Rickerby D, Valdre G, Valdre U (Eds.), Impact of Electron Scanning Probe Microscopy on Materials Research, Kluwer Academic Publishers, The Netherlands (1999)
Li B, Xie Y, Huang JX, Qian YT, Adv. Mater., 11(17), 1456 (1999)
Chichibu S, Mizutani T, Murakami K, Shioda T, Kurafuji T, J. Appl. Phys., 83, 3678 (1998)
Guo Q, Kim SJ, Kar M, Shafarman WN, Birkmire RW, Stach EA, Agrawal R, Hillhouse HW, Nano Lett., 8, 2982 (2008)
