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Received December 7, 2016
Accepted May 18, 2017
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Physico-chemical and dielectric relaxation studies of ionic surfactants in Time Domain Reflectometry (TDR)
Department of Physics, Faculty of Science and Humanities, SRM University, Kattankulathur, Kanchipuram Dt, Tamilnadu, 603203, India 1Department of Physics, Annamalai University, Annamalainagar, Cuddalore Dt. Tamilnadu, 608002, India 2Post Graduate and Research Department of Physics, (Ultrasonics/Bio-Physics Divisions), Thiru. Vi. Kalyanasundaram Govt Arts & Science College, Thiruvarur, Tamilnadu, 610003, India
s_nithu59@rediffmail.com
Korean Journal of Chemical Engineering, August 2017, 34(8), 2325-2330(6), 10.1007/s11814-017-0138-6
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Abstract
The properties of aqueous surfactant solutions with external additives are extensively useful in surfactantbased systems. To study the dielectric relaxation studies of aqueous ionic surfactants (SDS, CTAB, DPC) and aqueous butanol, benzyl alcohol, aniline and tributylamine were carried out for different concentrations at 303k. Dielectric relaxation spectroscopy (DRS) is valuable for understanding the dynamic process mainly in micellar systems. Time domain dielectric data were obtained through HP54750A oscilloscope and TDR plug-in-module. The relaxation times were determined through the well-known Cole-Cole method. The superposition of two relaxation times gives the dielectric relaxation time obtained from the hydrated water molecule with rotations around the micelle, ions and another hydrophobic inner side of the micelle. Viscosity measurements were used to correlate the dielectric data. The Kirkwood correlation factor (gf), effective Kirkwood correlation factor (geff), Bruggeman Factor (fB), excess inverse relaxation time (1/τ)E, excess dielectric constant (εE) and free energy of activation (ΔFt) were also calculated. The effects of dielectric relaxation and viscous flow were interpreted and discussed.
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References
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Luksic M, Hribar-Lee B, Buchner R, Vlachy V, Phys. Chem. Chem. Phys., 11, 10053 (2009)
Hefter G, Buchner R, Hunger J, Stoppa A, ACS Symposium Series, The American Chemical Society, Washington, 1030, 61 (2010).
Placzek A, Hefter G, Rahman HMA, Buchner R, J. Phys. Chem. B, 115(10), 2234 (2011)
Lima FS, Chaimovich H, Cuccovia IM, Buchner R, Langmuir, 29(32), 10037 (2013)
Rahman HMA, Hefter G, Buchner R, J. Phys. Chem. B, 116(1), 314 (2012)
Buchner R, Barthel J, Annu. Rep. Prog. Chem., Sect. C, 97, 349 (2001)
Buchner R, Barthel J, Ber. Bunsenges. Phys. Chem., 101, 1509 (1997)
Venkatesan P, Sekaran GC, Prabhakara RMV, J. Phys. Chem., 44, 281 (2006)
Sato T, Fukasawa T, Arimaki K, Glatter O, Buchner R, J. Mol. Liq., 159, 76 (2011)
Thenappan T, Prabakar DA, J. Mol. Liq., 123, 72 (2006)
Lima FS, Cuccovia IM, Buchner R, Antunes FE, Lindman B, Miguel MG, Horinek D, Chaimovich H, Langmuir, 31(9), 2609 (2015)
Sato T, Buchner R, J. Chem. Phys., 118(10), 4606 (2003)
Sato T, Buchner R, J. Chem. Phys., 119(20), 10789 (2003)
Cole RH, Berbariani JG, Mashimo S, Chryssiko G, Burns A, Tomari E, J. Appl. Phys., 66, 792 (1989)
Bevington PR, Data Reduction and Error Analysis for the Physical Sciences, McGrawHill, NY (1969).
Ganesh T, Sabesan R, Krishnan S, J. Mol. Biol., 128, 77 (2006)
Kumar R, Sharma V, Rangra VS, Indian J. Pure Appl. Phys., 48, 415 (2010)
Rezus YL, Bakker HJ, Phys. Rev. Lett., 99, 148301 (2007)
Karunakaran DJSA, Ganesh T, Sylvester MM, Hudge P, Kumbharkhane AC, IOSR J. Appl. Phys., 7(1), 70 (2015)
Kumar S, Guhanahan L, J. Adv. Chem. Sci., 2(1), 198 (2016)
Dzida M, Kaatze U, J. Phys. Chem. B, 119(38), 12480 (2015)
Sudo S, Shinyashiki N, Kitsuki Y, Yagihara S, J. Phys. Chem. A, 106(3), 458 (2002)
Chen Z, Zhao KZ, Colloids Surf. A: Physicochem. Eng. Asp., 292(1-5), 42 (2007)
Nagy S, Szalai I, J. Mol. Biol., 164, 157 (2011)
