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필름 가공 공정에서의 이상 감지 및 진단
Fault Detection and Diagnosis in Film Processing Plants
포항공과대학교 화학공학과, 790-784 경북 포항시 남구 효자동 산 31 1포항공과대학교 화학공학과, 아이시스텍(주), 790-784 경북 포항시 남구 효자동 산 31 2도레이새한(주), 730-350 경북 구미시 임수동 93-1
Department of Chemical Engineering, Pohang University of Science and Technology, San 31, Hyoja-dong, Nam-gu, Pohang, Kyungbuk 790-784, Korea 1Department of Chemical Engineering and ISYSTECH Co. Ltd., Pohang University of Science and Technology, San 31, Hyoja-dong, Nam-gu, Pohang, Kyungbuk 790-784, Korea 2ToraySaehan Co. Ltd., 93-1, Imsu-dong, Gumi, Kyungbuk 730-350, Korea
chan@postech.ac.kr
HWAHAK KONGHAK, October 2003, 41(5), 585-591(7), NONE
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Abstract
최근 고분자 산업 시장의 세계화가 이뤄지면서, 필름 및 시트를 보다 높은 품질로 생산하고자 하는 요구가 증가하고 있다. 본 논문에서는 생산성을 떨어뜨리는 인자를 신속히 찾아내고 불량의 원인을 진단하는 필름공정용 다변량 통계 기법을 제안한다. 이 기법은 주성분 분석법을 기반으로 하는 품질 향상 방법으로, 공정 변수간의 상관관계를 고려하여 데이터를 압축한다. 제안한 방법을 필름 가공 공정의 현장 데이터에 적용하여, 거대한 데이터를 용도별로 나누어 그룹화하였다. 그리고 유체의 체류시간에 해당하는 데이터를 모델에 투영하여, 품질 불량이 나타나기 전 공정에서 이상이 생긴 것을 발견할 수 있었으며, 이 공정에서 고분자의 누수 현상이 있었음을 확인하였다.
The fierce competition in the polymer film and sheet market requires the industry to satisfy much higher product quality specifications. This paper proposes a monitoring and diagnosis method based on multivariate statistical techniques which help us reduce the amount of off-spec product. The method has been applied to an industrial web forming plant and has proven that process faults such as the leak of polymer fluid can be early detected before it is developed into the production of bad quality product.
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References
Boyle TJ, Can. J. Chem. Eng., 55, 457 (1977)
Bergh LG, Macgregor JF, Can. J. Chem. Eng., 65, 148 (1987)
VanAntwerp JG, Featherstone AP, Braatz RD, J. Proc. Cont., 11, 149 (2001)
Braatz RD, Tyler ML, Morari M, AIChE J., 38, 1329 (1992)
Rawlings JB, Chien IL, AIChE J., 42(3), 753 (1996)
VanAntwerp JG, Richard D, IEEE Trans. Control Syst. Technol., 8(3), 408 (2000)
Braatz RD, Ogunnaike BA, Featherstone AP, "Identification, Estimation, and Control of Sheet and Film Processes," in Proc. of the IFAC World Congr., Tarrytown, NY, 319-324 (1996)
Beecher AE, Bareiss RA, Tappi, 53(5), 847 (1970)
Hovd M, Braatz RD, Skogestad S, Automatica, 33, 433 (1996)
Featherstone AP, Braatz RD, Ind. Eng. Chem. Res., 37(2), 449 (1998)
Russell EL, Braatz RD, Comput. Chem. Eng., 22(7-8), 913 (1998)
Gilmour J, Wang LP, Chem. Eng. Sci., 57(7), 1091 (2002)
Wold S, Kim E, Geladi P, Chem. Int. Lab. Sys., 2, 37 (1987)
Harold H, J. Educ. Psychol., 24, 498 (1933)
Westerhuis JA, Gurden SP, Smilde AK, Chem Int. Lab. Sys., 51, 95 (2000)
Sebzalli YM, Wang XZ, Eng. Appl. Artif. Intell., 14, 607 (2001)
Bergh LG, Macgregor JF, Can. J. Chem. Eng., 65, 148 (1987)
VanAntwerp JG, Featherstone AP, Braatz RD, J. Proc. Cont., 11, 149 (2001)
Braatz RD, Tyler ML, Morari M, AIChE J., 38, 1329 (1992)
Rawlings JB, Chien IL, AIChE J., 42(3), 753 (1996)
VanAntwerp JG, Richard D, IEEE Trans. Control Syst. Technol., 8(3), 408 (2000)
Braatz RD, Ogunnaike BA, Featherstone AP, "Identification, Estimation, and Control of Sheet and Film Processes," in Proc. of the IFAC World Congr., Tarrytown, NY, 319-324 (1996)
Beecher AE, Bareiss RA, Tappi, 53(5), 847 (1970)
Hovd M, Braatz RD, Skogestad S, Automatica, 33, 433 (1996)
Featherstone AP, Braatz RD, Ind. Eng. Chem. Res., 37(2), 449 (1998)
Russell EL, Braatz RD, Comput. Chem. Eng., 22(7-8), 913 (1998)
Gilmour J, Wang LP, Chem. Eng. Sci., 57(7), 1091 (2002)
Wold S, Kim E, Geladi P, Chem. Int. Lab. Sys., 2, 37 (1987)
Harold H, J. Educ. Psychol., 24, 498 (1933)
Westerhuis JA, Gurden SP, Smilde AK, Chem Int. Lab. Sys., 51, 95 (2000)
Sebzalli YM, Wang XZ, Eng. Appl. Artif. Intell., 14, 607 (2001)
