Articles & Issues
- Language
- korean
- Conflict of Interest
- In relation to this article, we declare that there is no conflict of interest.
- Publication history
-
Received November 24, 2005
Accepted July 24, 2006
-
This is an Open-Access article distributed under the terms of the Creative Commons Attribution Non-Commercial License (http://creativecommons.org/licenses/bync/3.0) which permits
unrestricted non-commercial use, distribution, and reproduction in any medium, provided the original work is properly cited.
Copyright © KIChE. All rights reserved.
All issues
열분해 방식에 따른 고체 커패시터의 특성연구
A Study on the Characteristics of Solid Capacitor According to the Pyrolysis Methods
에너솔(주) 연구소, 462-722 성남시 중원구 상대원동 중앙인더스피아 2 806호
R&D Center, Enesol Co. Ltd., #806 Chung-Ang Induspia 2, Sangdaewon-dong, Chungwon-gu, Sungnam-si, Kyonggi-do 462-722, Korea
kjg8787@hanmail.net
Korean Chemical Engineering Research, December 2006, 44(6), 614-622(9), NONE Epub 2 January 2007
Download PDF
Abstract
질산망간수용액의 열분해에 의한 이산화망간 적용 Ta/Ta2O5/MnO2 커패시터의 특성 연구를 수행하였다. 질산망간 수용액의 TG/DSC 분석을 통해 약 230~250 ℃ 범위에서 단일상의 이산화망간이 생성되었다. 열분해 온도, 질산망간 수용액의 농도, 열분해 회수를 이산화망간 고체 전해질 생성의 기초 변수로 선정하고 이에 따른 커패시터 특성을 평가하였다. 최적 조성을 기준으로 복사열분해 방식이 대류열분해 방식에 비하여 우수한 특성을 발휘하였다. 이는 복사열 분해에 의해 상대적으로 구형의 작은 입자 상태의 이산화망간 입자들이 생성되고 이를 통해 미세 다공성 구조의 커패시터 소결체 내부에 균일하고 치밀한 이산화망간 고체전해질 층이 생성되는 것에서 기인하는 결과임을 확인하였다.
A Study on the characteristics of Ta/Ta2O5/MnO2 capacitor applied MnO2 by means of pyrolysis of manganese nitrate solution was carried out. Single phase of MnO2 was obtained in the pyrolysis temperature range of 230 to 250 ℃ by TG/DSC analysis on manganese nitrate solution. Temperature of pyrolysis, concentration of manganese nitrate solution and the number of pyrolysis were selected for the basic parameters of embodying MnO2 solid electrolyte and then the effects of these parameters on the characteristics of capacitor were estimated. The characteristics of capacitor pyrolyzed radiationally was superior to that of capacitor pyrolyzed convectionally on the basis of these optimized parameter conditions. It was verified that radiational pyrolysis formed smaller spherical MnO2 particles than those of convectional one relatively and these facts resulted in forming uniform and dense solid electrolyte layer into the microporous sintered body of capacitor.
Keywords
References
Kim JK, Yoo JY, Min HK, Ko HC, HWAHAK KONGHAK, 41(3), 337 (2003)
Kim J, Yu H, Hwang K, Kim K, J. Korean Ind. Eng. Chem., 14(6), 698 (2003)
Oka H, Ohi M, Fujiwara M, Funaya O, NEC Technical Report, 49(10), 72 (1996)
Kim J, Min H, Yu H, Kang K, J. Korean Ind. Eng. Chem., 12(6), 671 (2001)
Min HK, Kim JK, Jang KS, Oh EJ, HWAHAK KONGHAK, 41(3), 343 (2003)
Shin M, Kim J, Yeu T, J. Korean Ind. Eng. Chem., 15(7), 743 (2004)
Yamuchi Y, “Advanced in Tantalum Sintered Anode for Solid Electrolytic Capacitors,” Proceedings, Sym., on Electrochemstry, Japan, Oct. 23, 43 (1998)
General Technology, The latest Technologies of Capacitors and Materials, General Technology Press, Japan, 84-100 (1985)
Nishino A, in Munshi, M. Z. A.(Ed.), Handbook of Solid State Batteries & Capacitors, World Scientific, Singapore, 627-644 (1995)
Franklin RW, “Equivalent Series Resistance of Tantalum Capacitors,” AVX Limited, Paignton, England
Gill J, “Basic Tantalum Capacitor Technology,” AVX Limited, Paignton, England
Nishino A, Yoshida A, Hayakawa H, “Method of Producing Manganese Oxide Solid Electrolyte Capacitor,” U.S. Patent, No. 4,042,420 (1977)
Yoshida A, Nishino A, Denki Kagaku, 57(5), 408 (1989)
Gotoh T, Abe F, Ishizu T, Yoshio M, J. Power Sources, 60, 193 (1996)
Kozawa A, “Proc. Symp. MnO2 Electrode Vol. 85-4,” The Electrochemical Society Proc. Ser., Pennington, NJ, U.S. 384 (1985)
Kim J, Yu H, Hwang K, Kim K, J. Korean Ind. Eng. Chem., 14(6), 698 (2003)
Oka H, Ohi M, Fujiwara M, Funaya O, NEC Technical Report, 49(10), 72 (1996)
Kim J, Min H, Yu H, Kang K, J. Korean Ind. Eng. Chem., 12(6), 671 (2001)
Min HK, Kim JK, Jang KS, Oh EJ, HWAHAK KONGHAK, 41(3), 343 (2003)
Shin M, Kim J, Yeu T, J. Korean Ind. Eng. Chem., 15(7), 743 (2004)
Yamuchi Y, “Advanced in Tantalum Sintered Anode for Solid Electrolytic Capacitors,” Proceedings, Sym., on Electrochemstry, Japan, Oct. 23, 43 (1998)
General Technology, The latest Technologies of Capacitors and Materials, General Technology Press, Japan, 84-100 (1985)
Nishino A, in Munshi, M. Z. A.(Ed.), Handbook of Solid State Batteries & Capacitors, World Scientific, Singapore, 627-644 (1995)
Franklin RW, “Equivalent Series Resistance of Tantalum Capacitors,” AVX Limited, Paignton, England
Gill J, “Basic Tantalum Capacitor Technology,” AVX Limited, Paignton, England
Nishino A, Yoshida A, Hayakawa H, “Method of Producing Manganese Oxide Solid Electrolyte Capacitor,” U.S. Patent, No. 4,042,420 (1977)
Yoshida A, Nishino A, Denki Kagaku, 57(5), 408 (1989)
Gotoh T, Abe F, Ishizu T, Yoshio M, J. Power Sources, 60, 193 (1996)
Kozawa A, “Proc. Symp. MnO2 Electrode Vol. 85-4,” The Electrochemical Society Proc. Ser., Pennington, NJ, U.S. 384 (1985)
