원자힘현미경은 초미세크기의 물리적 특성을 규명하기 위한 수단으로서 지지 지질층의 물리적특성 규명에 이용되어 왔다. 원자힘현미경이 출현하기 이전에는 초미세관점에서 지지 지질층에서 발생하는 물리적 현상의 관찰이 전무하였다. 이 현미경은 탐침바늘(Cantilever)로 표면을 주사(Scanning)함으로써 표면의 초미세 형상(Morphology)을 제공하고 표면에 접근(Approach)했다가 후퇴(Retraction)하는 탐침바늘의 거동을 모니터링함으로써 힘곡선(Force Curve)을 나타낼 수 있다. 형상 파악을 통해 지지 지질층의 구조와 막 단백질이 지질층의 구조에 미치는 영향을 밝히는 연구가 진행되어 왔으며, 힘곡선을 통하여 지지 지질층 표면 특성-기계적·정전기적 특성-에 대한 연구가 진행되었다. 본 총설에서는 원자힘현미경을 이용하여 현재까지 진행된 지지 지질층의 구조와 표면 특성 연구에 대하여 소개하고 향후 연구진행 방향에 대하여 논의하고자 한다.

The atomic force microscopy(AFM) has been used, as a powerful tool, to investigate physical properties of supported-lipid layers. Prior to the advent of the AFM, no observation was performed for the physical phenomena at the nanometer-scale. This microscope provides nanometer-scale morphology by scanning surfaces with the cantilever and presents force curve by monitoring the behavior of the cantilever that approaches to surface and retracts from the surface. From the morphology, the structures of the supported lipid layer and the effect of other molecules on the structures have been investigated. From the force curve, the surface properties.electrostatic and mechanical properties-of the supported lipid layers have been studied. In this article, characterization of the structure and surface properties of the supported lipid layer is explained. Future perspectives and direction are also discussed.

Supported Lipid Layer AFM Morphology Force Curve Structure Surface Properties

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